About jhlee
Biography
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![[ATTACH]](/wiki/jhlee?rename=jhlee_profile.jpg&action=AttachFile "[ATTACH]"){kind=small}
Research Interests
Design automation of analog and mixed signal (AMS) systems, including
- Simulation-based optimization algorithms for analog circuits
- Functional verification of AMS models
- Equivalence checking of AMS models and implementations
- Fault analysis/diagnosis of production testing
My Research Projects
- Fault Coverage Analysis of Analog/Mixed-Signal Tests Based on Statistical Dissimilarity
- Variability-Aware, Discrete Optimization for Analog Circuits (Finished)
- Behavior model (XMODEL)을 기반으로 하는 System Timing Budge Analysis
Publications
Jiho Lee and Jaeha Kim, "Efficient Global Optimization of Analog Circuits using Predictive Response Surface Models on Discretized Design Space," IEEE Design & Test, Under Publication
Jiho Lee and Jaeha Kim, "Defining a Functional Coverage Metric for Analog Models," Frontiers in Analog CAD (FAC) , 2015
Jiho Lee and Jaeha Kim, "Investigations on the Optimal Support Vector Machine Classifiers for Predicting Design Feasibility in Analog Circuit Optimization", Journal of Semiconductor Technology and Science (JSTS), 2015
이지호 and 김재하, "Analysis of Characterizing Feasible Design Space of LC-VCO Using SVM Classifiers", 한국반도체학술대회, 2015
Jiho Lee and Jaeha Kim, "Predictive Global Optimization Method for Analog Circuit with Response Surface Methodology on Discrete Design Space," Frontiers in Analog CAD (FAC), 2014
Seobin Jung, Jiho Lee and Jaeha Kim, "Yield-Aware Pareto Front Extraction for Discrete, Hierarchical Optimization of Analog Circuits," IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2014
Seobin Jung, Jiho Lee and Jaeha Kim, "Variability-Aware, Discrete Optimization for Analog Circuits," IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2014
Jaeha Kim, Jiho Lee, Do-Gyoon Song, Taehwan Kim, Kyung-Hoon Kim, Seobin Jung, Sangho Youn, "Discretization and Discrimination Methods for Design, Verification, and Testing of Analog/Mixed-Signal Circuits," Custom Integrated Circuits Conference (CICC), 2013